Modeling and simulation of a resistive thermal probe

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dc.contributor.authorMin, Dong-Kiko
dc.contributor.authorHong, Seungbumko
dc.date.accessioned2018-01-30T02:31:45Z-
dc.date.available2018-01-30T02:31:45Z-
dc.date.created2017-12-29-
dc.date.issued2007-10-
dc.identifier.citation6th IEEE Conference on SENSORS, IEEE SENSORS 2007, pp.320 - 324-
dc.identifier.urihttp://hdl.handle.net/10203/238147-
dc.description.abstractResistive probe can detect the variation of electric field from a media by its current variation. Equivalently it is a variable resistor, which is sensitive to electric field. However, the experimental results show that another mechanism is involved in it and it is considered to have a relationship with the topography of the media. In this paper, this newly observed mechanism is explained as thermal effect with simulation results. This can affect the signal quality as a noise source or detection limitation of the field variation or, in other hand can be used as a highly localized thermal tip sensor. © 2007 IEEE.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleModeling and simulation of a resistive thermal probe-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage320-
dc.citation.endingpage324-
dc.citation.publicationname6th IEEE Conference on SENSORS, IEEE SENSORS 2007-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationHyatt Regency Atlanta, Atlanta, Georgia-
dc.identifier.doi10.1109/ICSENS.2007.4388401-
dc.contributor.localauthorHong, Seungbum-
dc.contributor.nonIdAuthorMin, Dong-Ki-
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MS-Conference Papers(학술회의논문)
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