Browse "RIMS Collection" by Author PAEK, MC
Showing results 1 to 3 of 3
| A STUDY OF LATTICE DAMAGE IN SILICON INDUCED BY BF2+ ION-IMPLANTATION PAEK, MC; KWON, OJ; Lee, JeongYong; Lim, Ho Bin, JOURNAL OF APPLIED PHYSICS, v.70, no.8, pp.4176 - 4180, 1991-10 |
| EFFECT OF LATTICE DAMAGE ON IMPURITY DEPTH PROFILES IN BF2+-IMPLANTED SILICON PAEK, MC; Lim, Ho Bin; KWON, OJ; KANG, SW, SURFACE & COATINGS TECHNOLOGY, v.43, no.1-3, pp.986 - 995, 1990-12 |
| EFFECTS OF ANNEALING ON THE DAMAGE MORPHOLOGIES IN BF2+ ION-IMPLANTED (100)SILICON PAEK, MC; Lim, Ho Bin; Lee, JeongYong, JOURNAL OF MATERIALS SCIENCE, v.26, no.10, pp.2603 - 2607, 1991-05 |
Discover
Type
- 4,798 Article
- 3,515 Conference
- 1,492 Patent
Open Access
- 223 OA Article
Date issued
- 1,308 2020 - 2024
- 2,942 2010 - 2019
- 2,339 2000 - 2009
- 1,846 1990 - 1999
- 579 1980 - 1989
- 3 1964 - 1969