Browse "RIMS Collection" by Author Kadry, Wisam
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| Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms Kadry, Wisam; Krestyashyn, Dimtry; Morgenshtein, Arkadiy; Nahir, Amir; Sokhin, Vitali; Park, Jin Sung; Park, Sung-Boem; et al, IEEE DESIGN & TEST, v.34, no.1, pp.65 - 76, 2017-02 |
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