Browse "RIMS Collection" by Title 

Showing results 1601 to 1620 of 11385

1601
Characterization of Groundwater Flow by Field Hydraulic Tests, Flow Rate Measurement, and Numerical Simulation in the Gneiss of the Ingulam Valley

gye-nam kim; ja-kong koo; ji-hoon lee, JOURNAL OF ENVIRONMENTAL HYDROLOGY, v.3, no.1, pp.18 - 27, 1995

1602
Characterization of heat shock protein 40 and 90 in Chironomus riparius larvae: Effects of di(2-ethylhexyl) phthalate exposure on gene expressions and mouthpart deformities

Park K.; Kwak I.-S., CHEMOSPHERE, v.74, no.1, pp.89 - 95, 2008

1603
Characterization of large-scale SMTP traffic: The coexistence of the poisson process and self-similarity

Lee Y.; Kim J.-S., 2008 IEEE International Symposium on Modeling, Analysis and Simulation of Computer and Telecommunication Systems, MASCOTS, 2008-09-08

1604
Characterization of magnetic properties in Co/Pd multilayers by Hall effect measurement

Lee, HS; Choe, SB; Shin, Sung-Chul; Kim, CG, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.239, pp.343 - 345, 2002-02

1605
Characterization of Mutagenicity Test and Identification of N-Nitroso Mutagens in Some Soju Alcoholic Spirits

Kim, Ki-Hyung; Bae, Yunjin; Lee, Kyu-Sup; Moon, Yuseok; Kwon, Chae Hwa; Ahn, Jung Hoon, JOURNAL OF THE AMERICAN SOCIETY OF BREWING CHEMISTS, v.70, no.3, pp.182 - 185, 2012

1606
CHARACTERIZATION OF ORGANIC AND INORGANIC BYPRODUCTS FROM FIELD-SCALE GASIFICATION/INCINERATOR FOR WASTE TIRES

ja-kong koo; seok-wan kim, TOXICOLOGICAL AND ENVIRONMENTAL CHEMISTRY, v.52, pp.203 - 214, 1995

1607
Characterization of oxide Charging in a Magnetically Enhanced Rie Polysilicon Etcher

Hyung-Cheol Shin, Proc. 11th International Syposium on Plasma Chemistry, pp.1534 - 1539, 1993

1608
CHARACTERIZATION OF PBTIO3 THIN-FILMS DEPOSITED ON PT/TI/SIO2/SI SUBSTRATES BY ECR PECVD

CHUNG, SW; SHIN, JS; KIM, JW; No, Kwangsoo; Chun , Soung Soon; Lee, Won-Jong, JOURNAL OF MATERIALS RESEARCH, v.10, no.2, pp.447 - 452, 1995-02

1609
Characterization of Process-Dependent Traps in polycrystalline Silicon Thin Film Transistors using Charge Pumping Methods

Chul-Hi Han, 190th Eletrochemical Society Meeting, pp.678 - 678, 1996

1610
Characterization of Process-Induced Damage During Aluminum Etching and Photoresist Ashing

Hyung-Cheol Shin, International Wafer Level Reliability Workshop, pp.133 - 144, 1991

1611
Characterization of squalene-induced PgCYP736B involved in salt tolerance by modulating key genes of abscisic acid biosynthesis

Balusamy, Sri Renukadevi; Rahimi, Shadi; Yang, Deok-Chun, INTERNATIONAL JOURNAL OF BIOLOGICAL MACROMOLECULES, v.121, pp.796 - 805, 2019-01

1612
Characterization of Subgap Density-of-States by Sub-Bandgap Optical Charge Pumping in In0.53Ga0.47As Metal-Oxide-Semiconductor Field-Effect Transistors

Yoo, Han Bin; Kim, Seong Kwang; Kim, Junyeap; Yu, Jintae; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.7, pp.4287 - 4291, 2020-07

1613
Characterization of superpararnagnetic "core-shell" nanoparticles and monitoring their anisotropic phase transition to ferromagnetic "solid solution" nanoalloyse

Park J.-I.; Kim M.G.; Jun Y.-W.; Lee J.S.; Lee W.-R.; Cheon J., JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.126, no.29, pp.9072 - 9078, 2004

1614
CHARACTERIZATION OF THE JACOBSON RADICAL IN TERNARY ALGEBRAS

Myung, Hyo Chul, PROCEEDINGS OF THE AMERICAN MATHEMATICAL SOCIETY, v.38, no.2, pp.228 - 234, 1973

1615
Characterization of Thin Oxide Damage During Aluminum Etching and Photoresist Ashing Processes

Hyung-Cheol Shin, International Symposium on VLSI Technology,Systems and Applications, pp.210 - 213, 1991

1616
Characterizations of compact Toeplitz operators

최부림, Abstracts, Fall Meeting Korean Math. Soc., 1992

1617
Charge disproportionation-induced multiferroics and electric field control of magnetism in a 2D MXene - Mo2NCl2

Xin, Chao; Song, Bingqian; Yin, Yaohui; Wang, Ai; Sun, Zhixin; Jin, Guangyong; Song, Yongli; et al, NANOSCALE, v.15, no.36, pp.14923 - 14930, 2023-09

1618
CHARGE EMISSION AND PRECURSOR ACCUMULATION IN THE MULTIPLE-PULSE DAMAGE REGIME OF SILICON

Jhee, Youn Kyu; BECKER, MF; WALSER, RM, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.2, no.10, pp.1626 - 1633, 1985

1619
Charge-carrier mediated ferromagnetism in Mo-doped In2O3 films

Park, Chang-Yup; You, Chun-Yeol; Jeon, Kun-Rok; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.100, no.22, 2012-05

1620
Charged Particle Exoemission from silicon during Multiple-Pulse Laser-Induced Damage

Jhee, Youn Kyu, In Proceedings of the 14th Symposium on Optical Materials for High Power Lasers, 1982

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