Browse "RIMS Collection" by Title
Showing results 1601 to 1620 of 11393
| Characterization of Groundwater Flow by Field Hydraulic Tests, Flow Rate Measurement, and Numerical Simulation in the Gneiss of the Ingulam Valley gye-nam kim; ja-kong koo; ji-hoon lee, JOURNAL OF ENVIRONMENTAL HYDROLOGY, v.3, no.1, pp.18 - 27, 1995 |
| Characterization of heat shock protein 40 and 90 in Chironomus riparius larvae: Effects of di(2-ethylhexyl) phthalate exposure on gene expressions and mouthpart deformities Park K.; Kwak I.-S., CHEMOSPHERE, v.74, no.1, pp.89 - 95, 2008 |
| Characterization of large-scale SMTP traffic: The coexistence of the poisson process and self-similarity Lee Y.; Kim J.-S., 2008 IEEE International Symposium on Modeling, Analysis and Simulation of Computer and Telecommunication Systems, MASCOTS, 2008-09-08 |
| Characterization of magnetic properties in Co/Pd multilayers by Hall effect measurement Lee, HS; Choe, SB; Shin, Sung-Chul; Kim, CG, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.239, pp.343 - 345, 2002-02 |
| Characterization of Mutagenicity Test and Identification of N-Nitroso Mutagens in Some Soju Alcoholic Spirits Kim, Ki-Hyung; Bae, Yunjin; Lee, Kyu-Sup; Moon, Yuseok; Kwon, Chae Hwa; Ahn, Jung Hoon, JOURNAL OF THE AMERICAN SOCIETY OF BREWING CHEMISTS, v.70, no.3, pp.182 - 185, 2012 |
| CHARACTERIZATION OF ORGANIC AND INORGANIC BYPRODUCTS FROM FIELD-SCALE GASIFICATION/INCINERATOR FOR WASTE TIRES ja-kong koo; seok-wan kim, TOXICOLOGICAL AND ENVIRONMENTAL CHEMISTRY, v.52, pp.203 - 214, 1995 |
| Characterization of oxide Charging in a Magnetically Enhanced Rie Polysilicon Etcher Hyung-Cheol Shin, Proc. 11th International Syposium on Plasma Chemistry, pp.1534 - 1539, 1993 |
| CHARACTERIZATION OF PBTIO3 THIN-FILMS DEPOSITED ON PT/TI/SIO2/SI SUBSTRATES BY ECR PECVD CHUNG, SW; SHIN, JS; KIM, JW; No, Kwangsoo; Chun , Soung Soon; Lee, Won-Jong, JOURNAL OF MATERIALS RESEARCH, v.10, no.2, pp.447 - 452, 1995-02 |
| Characterization of Process-Dependent Traps in polycrystalline Silicon Thin Film Transistors using Charge Pumping Methods Chul-Hi Han, 190th Eletrochemical Society Meeting, pp.678 - 678, 1996 |
| Characterization of Process-Induced Damage During Aluminum Etching and Photoresist Ashing Hyung-Cheol Shin, International Wafer Level Reliability Workshop, pp.133 - 144, 1991 |
| Characterization of squalene-induced PgCYP736B involved in salt tolerance by modulating key genes of abscisic acid biosynthesis Balusamy, Sri Renukadevi; Rahimi, Shadi; Yang, Deok-Chun, INTERNATIONAL JOURNAL OF BIOLOGICAL MACROMOLECULES, v.121, pp.796 - 805, 2019-01 |
| Characterization of Subgap Density-of-States by Sub-Bandgap Optical Charge Pumping in In0.53Ga0.47As Metal-Oxide-Semiconductor Field-Effect Transistors Yoo, Han Bin; Kim, Seong Kwang; Kim, Junyeap; Yu, Jintae; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.7, pp.4287 - 4291, 2020-07 |
| Characterization of superpararnagnetic "core-shell" nanoparticles and monitoring their anisotropic phase transition to ferromagnetic "solid solution" nanoalloyse Park J.-I.; Kim M.G.; Jun Y.-W.; Lee J.S.; Lee W.-R.; Cheon J., JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.126, no.29, pp.9072 - 9078, 2004 |
| CHARACTERIZATION OF THE JACOBSON RADICAL IN TERNARY ALGEBRAS Myung, Hyo Chul, PROCEEDINGS OF THE AMERICAN MATHEMATICAL SOCIETY, v.38, no.2, pp.228 - 234, 1973 |
| Characterization of Thin Oxide Damage During Aluminum Etching and Photoresist Ashing Processes Hyung-Cheol Shin, International Symposium on VLSI Technology,Systems and Applications, pp.210 - 213, 1991 |
| Characterizations of compact Toeplitz operators 최부림, Abstracts, Fall Meeting Korean Math. Soc., 1992 |
| Charge disproportionation-induced multiferroics and electric field control of magnetism in a 2D MXene - Mo2NCl2 Xin, Chao; Song, Bingqian; Yin, Yaohui; Wang, Ai; Sun, Zhixin; Jin, Guangyong; Song, Yongli; et al, NANOSCALE, v.15, no.36, pp.14923 - 14930, 2023-09 |
| CHARGE EMISSION AND PRECURSOR ACCUMULATION IN THE MULTIPLE-PULSE DAMAGE REGIME OF SILICON Jhee, Youn Kyu; BECKER, MF; WALSER, RM, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.2, no.10, pp.1626 - 1633, 1985 |
| Charge-carrier mediated ferromagnetism in Mo-doped In2O3 films Park, Chang-Yup; You, Chun-Yeol; Jeon, Kun-Rok; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.100, no.22, 2012-05 |
| Charged Particle Exoemission from silicon during Multiple-Pulse Laser-Induced Damage Jhee, Youn Kyu, In Proceedings of the 14th Symposium on Optical Materials for High Power Lasers, 1982 |
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