Verification of Directed Self-Assembly (DSA) Guide Patterns through Machine Learning

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Verification of full-chip DSA guide patterns (GPs) through simulations is not practical due to long runtime. We develop a decision function (or functions), which receives n geometry parameters of a GP as inputs and predicts whether the GP faithfully produces desired contacts (good) or not (bad). We take a few sample GPs to construct the function; DSA simulations are performed for each GP to decide whether it is good or bad, and the decision is marked in n-dimensional space. The hyper-plane that separates good marks and bad marks in that space is determined through machine learning process, and corresponds to our decision function. We try a single global function that can be applied to any GP types, and a series of functions in which each function is customized for different GP type; they are then compared and assessed in 10nm technology.
Publisher
SPIE
Issue Date
2015-02-26
Language
English
Citation

Conference on Alternative Lithographic Technologies VII

ISSN
0277-786X
DOI
10.1117/12.2085644
URI
http://hdl.handle.net/10203/225313
Appears in Collection
EE-Conference Papers(학술회의논문)
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