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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

팔라듐 나노구조 형상에 따른 크랙 발생 경향과 수소 감지 성능 비교

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이재신 / 최광욱 / 서민호 / 유재영 / 조민승 / 윤준보researcher
Publisher
마이크로나노시스템학회
Issue Date
2017-03-31
Language
Korean
Citation

제19회 한국MEMS학술대회

URI
http://hdl.handle.net/10203/223995
Appears in Collection
EE-Conference Papers(학술회의논문)
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