DSpace at KOASAS: Atom probe tomography of compound semiconductors for photovoltaic and light-emitting device applications

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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Atom probe tomography of compound semiconductors for photovoltaic and light-emitting device applications

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Choi, Pyuck-Pa researcher / Cojocaru-Mirédin, Oana / Abou-Ras, Daniel / Caballero, Raquel / Raabe, Dierk / Smentkowski, Vincent S / Park, Chan Gyung / Gu, Gil Ho / Mazumder, Baishakhi / Wong, Man Hoi / Hu, Yan Ling / Melo, Thiago P / Speck, James S

Publisher: Microscopy Society of America

Issue Date: 2012-05

Language: English

Citation: Microscopy Today, v.20, no.3, pp.18 - 24

ISSN: 1551-9295

DOI: 10.1017/S1551929512000235

URI: http://hdl.handle.net/10203/207076

Appears in Collection: MS-Journal Papers(저널논문)

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