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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Atom probe tomography of compound semiconductors for photovoltaic and light-emitting device applications

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dc.contributor.authorChoi, Pyuck-Pako
dc.contributor.authorCojocaru-Mirédin, Oanako
dc.contributor.authorAbou-Ras, Danielko
dc.contributor.authorCaballero, Raquelko
dc.contributor.authorRaabe, Dierkko
dc.contributor.authorSmentkowski, Vincent Sko
dc.contributor.authorPark, Chan Gyungko
dc.contributor.authorGu, Gil Hoko
dc.contributor.authorMazumder, Baishakhiko
dc.contributor.authorWong, Man Hoiko
dc.contributor.authorHu, Yan Lingko
dc.contributor.authorMelo, Thiago Pko
dc.contributor.authorSpeck, James Sko
dc.date.accessioned2016-05-10T08:22:31Z-
dc.date.available2016-05-10T08:22:31Z-
dc.date.created2016-02-11-
dc.date.created2016-02-11-
dc.date.issued2012-05-
dc.identifier.citationMicroscopy Today, v.20, no.3, pp.18 - 24-
dc.identifier.issn1551-9295-
dc.identifier.urihttp://hdl.handle.net/10203/207076-
dc.languageEnglish-
dc.publisherMicroscopy Society of America-
dc.titleAtom probe tomography of compound semiconductors for photovoltaic and light-emitting device applications-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume20-
dc.citation.issue3-
dc.citation.beginningpage18-
dc.citation.endingpage24-
dc.citation.publicationnameMicroscopy Today-
dc.identifier.doi10.1017/S1551929512000235-
dc.contributor.localauthorChoi, Pyuck-Pa-
dc.contributor.nonIdAuthorCojocaru-Mirédin, Oana-
dc.contributor.nonIdAuthorAbou-Ras, Daniel-
dc.contributor.nonIdAuthorCaballero, Raquel-
dc.contributor.nonIdAuthorRaabe, Dierk-
dc.contributor.nonIdAuthorSmentkowski, Vincent S-
dc.contributor.nonIdAuthorPark, Chan Gyung-
dc.contributor.nonIdAuthorGu, Gil Ho-
dc.contributor.nonIdAuthorMazumder, Baishakhi-
dc.contributor.nonIdAuthorWong, Man Hoi-
dc.contributor.nonIdAuthorHu, Yan Ling-
dc.contributor.nonIdAuthorMelo, Thiago P-
dc.contributor.nonIdAuthorSpeck, James S-
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MS-Journal Papers(저널논문)
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