A Novel SSIM Index for Image Quality Assessment using a New Luminance Adaptation Effect Model in Pixel Intensity Domain

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Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2015-12-14
Language
English
Citation

IEEE International Conference on Visual Communications and Image Processing

URI
http://hdl.handle.net/10203/204135
Appears in Collection
EE-Conference Papers(학술회의논문)
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