A Novel SSIM Index for Image Quality Assessment using a New Luminance Adaptation Effect Model in Pixel Intensity Domain
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bae, Sung Ho | ko |
| dc.contributor.author | Kim, Mun Churl | ko |
| dc.date.accessioned | 2016-04-18T04:41:22Z | - |
| dc.date.available | 2016-04-18T04:41:22Z | - |
| dc.date.created | 2015-11-24 | - |
| dc.date.created | 2015-11-24 | - |
| dc.date.created | 2015-11-24 | - |
| dc.date.issued | 2015-12-14 | - |
| dc.identifier.citation | IEEE International Conference on Visual Communications and Image Processing | - |
| dc.identifier.uri | http://hdl.handle.net/10203/204135 | - |
| dc.language | English | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | A Novel SSIM Index for Image Quality Assessment using a New Luminance Adaptation Effect Model in Pixel Intensity Domain | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000399132000019 | - |
| dc.identifier.scopusid | 2-s2.0-84979082253 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE International Conference on Visual Communications and Image Processing | - |
| dc.identifier.conferencecountry | SI | - |
| dc.identifier.conferencelocation | NEC - Nanyang Executive Centre | - |
| dc.contributor.localauthor | Kim, Mun Churl | - |
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