Showing results 39 to 67 of 67
Impact of Plasma Charging Damage and Diode Protection on Scaled Thin Oxide Hyung-Cheol Shin, IEDM Technical Digest, pp.467 - 470, 1993 |
Integrity of Gate Oxide on TFSOI Materials Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.22 - 23, 1995 |
Lateral Silicon Field Emission Devices using Electron Beam Lithography Hyung-Cheol Shin, Micoroprocesses and Nanotechnology'99, pp.134 - 135, 1999 |
Materials, Device and Gate Oxide Integrith Evaluation of Simox and Bonded SOI Wafers Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.143 - 145, 1995 |
MOS Image Sensor Cell Suppressed Blooming 신형철, Proc. of Conference of KITE, pp.308 - 311, 1987 |
MOS Memory Using Si Nanocrystals Formed by Wet Etching of Poly-Silicon Along Grain Boundaries Hyung-Cheol Shin, 2000 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, pp.221 - 224, 2000 |
Optimization of Spiral Inductors on Siliocon Substrate 신형철, IDEC Conference 2002-Summer, pp.49 - 52, 2002 |
Optimization of Symmetric Spiral Inductors on Siliocon Substrate 신형철, Agilent EEsof User Workshop, pp.58 - 62, 2002 |
P-channel Nano Crystal Memory Hyung-Cheol Shin, 2000 China-Korea Joint Symposium on Semiconductor Physics and Device Application, pp.19 - 19, 2000 |
Physical modeling of substrate resistance in RF MOSFETs Han J.; Je M.; Shin H., 2003 Nanotechnology Conference and Trade Show - Nanotech 2003, v.2, pp.290 - 293, 2003-02-23 |
Physical Modeling of Substrate Resistance in RF MOSFETs Hyung-Cheol Shin, Workshop on Compact Modeling at the 5th International Conference on Modeling and Simulation of Microsystems, pp.335 - 338, 2003 |
Physical RF modeling of Junction Varactors Hyung-Cheol Shin, SSDM 2002, pp.418 - 419, 2002 |
Plasma-Etching induced Damage to Thin Oxide Hyung-Cheol Shin, IEEE/SEMI Advanced Semiconductor Manufacturing Conference, pp.79 - 83, 1992 |
PMOS-based Si Nano-crystal Memory Hyung-Cheol Shin, Silicon nanoelectronics workshop, pp.10 - 11, 1999 |
Process-Induced Charging Damage in PETEOS for Interlevel Dielectric Applications Hyung-Cheol Shin, International Symposium on Plasma Process-Induced Damage, pp.109 - 112, 1996 |
Programming and Erasing Characteristics of P-channel Nano-crystal Memory Hyung-Cheol Shin, Semicon Korea Technical Symposium 2000, pp.5 - 10, 2000 |
Quantized Canductance of a Gate-All-Around Silicon Quantum Wire Transistor Hyung-Cheol Shin, MNC(Microprocesses and Nanotechnology Conference, pp.150 - 151, 1998 |
Recessed Channel(RC) SOI NMOSFET's with Self-Aligned Polysilicon Gate Formed on the RC Region Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.122 - 123, 1996 |
RF characteristics of 30 nm MOSFETs with non-overlapped source-drain to gate Hyung-Cheol Shin, Silicon Nanoelectronics Workshop 2002, 2002 |
Silicon MOS Memory with self-aligned Quantum Dot on Narow Channel Hyung-Cheol Shin, ICVC99, pp.187 - 189, 1999 |
Silicon nano-crystal memory with tunneling nitride Hyung-Cheol Shin, International Conference on Solid State Devices and Materials, pp.170 - 171, 1998 |
Sub 4-nm Polyoxide Using ECR(Electron Cyclotron Resonance) N2O Plasma Oxidation Hyung-Cheol Shin, 2000 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, pp.25 - 30, 2000 |
TFSOI Complementary BiCMOS Technology for Low Power RF Mixed-Mode Applications Hyung-Cheol Shin, IEEE Custom Integrated Circuits Conference, pp.35 - 38, 1996 |
Thickness and Other Defects on Oxide and Interface Reliability due to Plasma Processing Hyung-Cheol Shin, Proc. IEEE International Reliability Phys. Symp., pp.272 - 279, 1993 |
Thin Oxide Damage by Plasma Etching and Ashing Processes Hyung-Cheol Shin, Proc. IEEE International Reliability Phys. Symp., pp.37 - 41, 1992 |
Transient Behaviors in Partially Depleted Thin Film SOI Devices Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.4 - 6, 1995 |
Two Band Tunneling Currents in Dual-Gate CMOSFET with Ultrathin Gate Oxide Hyung-Cheol Shin, ICSMM 2000, pp.108 - 109, 2000 |
Ultra thin oxide grown on polysilicon by ECR(Electron Cyclotron Resonance) N2O Plasma Hyung-Cheol Shin, 5th International Symposium on Plasma Process-Induced Damage 2000, no.2000, pp.133 - 136, 2000 |
열 영상을 위한 Hg0.7Cd0.3Te 128X1 적외선 감지소자 어레이 및 실리콘 Readout 회로 제작 신형철; 이성훈; 윤난영; 배수호; 김충기, 국방소재 학술대회, pp.47 - 60, 1996 |
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