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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| A physical-based analytical turn-on model of polysilicon thin-film transistors for circuit simulation Yang, GY; Hur, SH; Han, Chul-Hi, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.46, no.1, pp.165 - 172, 1999-01 | |
| Endurance characteristics and degradation mechanism of polysilicon thin film transistor EEPROMs with electron cyclotron resonance NaO-plasma gate oxide Lee, NI; Lee, JW; Han, Chul-Hi, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.38, no.4B, pp.2215 - 2218, 1999-04 | |
| A poly-Si thin-film transistor EEPROM cell with a folded floating gate Hur, SH; Lee, NI; Lee, JW; Han, Chul-Hi, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.46, no.2, pp.436 - 438, 1999-02 |
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