Browse "RIMS Journal Papers" by Subject gate delay
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| Gate Delay Characteristics of a Sub-30nm MOS Device with Non-Overlapped Source-Drain to Gate Fegion hyunjin lee; sung-il chang; hyungcheol shin; joungho lee, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.41, no.6, pp.937 - 941, 2002-12 |
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