Browse "RIMS Journal Papers" by Subject BORON
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| A STUDY OF LATTICE DAMAGE IN SILICON INDUCED BY BF2+ ION-IMPLANTATION PAEK, MC; KWON, OJ; Lee, JeongYong; Lim, Ho Bin, JOURNAL OF APPLIED PHYSICS, v.70, no.8, pp.4176 - 4180, 1991-10 |
| EFFECT OF LATTICE DAMAGE ON IMPURITY DEPTH PROFILES IN BF2+-IMPLANTED SILICON PAEK, MC; Lim, Ho Bin; KWON, OJ; KANG, SW, SURFACE & COATINGS TECHNOLOGY, v.43, no.1-3, pp.986 - 995, 1990-12 |
| EFFECTS OF HEAT-TREATMENTS ON COERCIVITY AND MICROSTRUCTURE IN ND15FE77B8 SINTERED MAGNETS PI, SH; CHOI, JM; KIM, YG, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.32, no.1-2, pp.89 - 91, 1995-06 |
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