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Improvement of the axial resolution in confocal microscopy by the use of heterodyne interference Lee, Seungwoo; Gweon, Dae-Gab, MEASUREMENT SCIENCE & TECHNOLOGY, v.19, no.10, 2008-10 |
Method for the improvement of lateral resolution in stimulated emission depletion microscopy using a pupil filter Yoo, Hongki; Song, Incheon; Kim, Taehoon; Gweon, Dae-Gab, MEASUREMENT SCIENCE & TECHNOLOGY, v.18, no.8, pp.N61 - N64, 2007-08 |
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