Improvement of the axial resolution in confocal microscopy by the use of heterodyne interference

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A technique for improving the axial resolution of confocal microscopy is proposed and demonstrated. Based on the interference between two diffraction-limited spots separated along the optical axis, a field domain confined by the heterodyne interference is generated. The effective region of illumination made by the interference makes the point-spread function (PSF) of the confocal microscope sharper. The three-dimensional imaging equations for both coherent and incoherent systems are derived. Numerical simulation and experiment show that the full-width-at-half-maximum (FWHM) of the PSF can be improved by a factor of 1.78 and 1.41, respectively.
Publisher
IOP PUBLISHING LTD
Issue Date
2008-10
Language
English
Article Type
Article
Keywords

3D WIDEFIELD MICROSCOPY; POINT-SPREAD FUNCTION; 2 OBJECTIVE LENSES; FLUORESCENCE MICROSCOPY; 2-PHOTON EXCITATION; SCANNING MICROSCOPE; LIGHT-MICROSCOPY; SUPERRESOLUTION; RESTORATION; FILTERS

Citation

MEASUREMENT SCIENCE & TECHNOLOGY, v.19, no.10

ISSN
0957-0233
DOI
10.1088/0957-0233/19/10/105502
URI
http://hdl.handle.net/10203/92227
Appears in Collection
ME-Journal Papers(저널논문)
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