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Dummy Gate-Assisted n-MOSFET Layout for a Radiation-Tolerant Integrated Circuit Lee, Min Su; Lee, Hee Chul, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.60, no.4, pp.3084 - 3091, 2013-08 |
Simulation and ground test for the total ionizing dose effects of STSAT-2 Ryu, Kwangsun; Shin, Goo-Hwan; Kim, Hyung-Myung; Kim, Sungjoon; Ko, Dai-Ho; Kim, Heejun; Min, KyoungWook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.50, no.5, pp.1552 - 1556, 2007-05 |
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