Browse "School of Electrical Engineering(전기및전자공학부)" by Subject radiation-induced leakage current
Showing results 1 to 4 of 4
| A comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation Cho, Byung Jin; Kim, SJ; Ling, CH; Joo, MS; Yeo, IS, SOLID-STATE ELECTRONICS, v.44, no.7, pp.1289 - 1292, 2000-07 |
| Bias and thermal annealings of radiation-induced leakage currents in thin-gate oxides Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung Jin, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.47, no.6, pp.2764 - 4, 2000-12 |
| Dummy Gate-Assisted n-MOSFET Layout for a Radiation-Tolerant Integrated Circuit Lee, Min Su; Lee, Hee Chul, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.60, no.4, pp.3084 - 3091, 2013-08 |
| Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, CH; Ling, CH; Cho, Byung Jin; Kim, SJ; Cheng, ZY, SOLID-STATE ELECTRONICS, v.44, no.11, pp.2001 - 2007, 2000-11 |
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