Browse "School of Electrical Engineering(전기및전자공학부)" by Author Bang, Tewook
Showing results 13 to 18 of 18
| Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 |
| Low-Frequency Noise Characteristics in SONOS Flash Memory with Vertically Stacked Nanowire FETs = 수직 적층 나노와이어 트렌지스터 기반 비휘발성 플래시 메모리에서의 저주파 잡음 특성 분석link Bang, Tewook; Choi, Yang-Kyu; et al, 한국과학기술원, 2017 |
| Optimization of the intrinsic length of a PIN diode for a reconfigurable antenna Kim, Da-Jin; Bang, Tewook; Hur, Jae; Kim, Choong-Ki; Choi, Yang-Kyu; Kim, Cheol Ho; Park, Bonghyuk, 15th International Conference on Electronics, Information, and Communications, ICEIC 2016, Institute of Electrical and Electronics Engineers Inc., 2016-01 |
| Reply to Comments by Ortiz-Conde et al. Kim, Gun-Hee; Bae, Hagyoul; Hur, Jae; Kim, Choong-Ki; Lee, Geon-Bum; Bang, Tewook; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.9, pp.4022 - 4024, 2018-09 |
| Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 |
| Vertically Integrated Multiple Nanowire Field Effect Transistor Lee, Byung Hyun; Kang, Min Ho; Ahn, Dae Chul; Park, Jun Young; Bang, Tewook; Jeon, Seung Bae; Hur, Jae; et al, NANO LETTERS, v.15, no.12, pp.8056 - 8061, 2015-12 |
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