Showing results 1 to 3 of 3
Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.11, 2010-09 |
Persistent photoconductivity in Hf-In-Zn-O thin film transistors Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.14, 2010-10 |
Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors Lee, Sungsik; Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Jeon, Sanghun; Kim, Changjung; Song, I-Hun; et al, APPLIED PHYSICS LETTERS, v.98, no.20, 2011-05 |
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