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Demonstration of Low Vt NMOSFETs Using Thin HfLaO in ALD TiN/HfSiO Gate Stack Cho, Byung Jin; Park, CS; Song, SC; Bersuker, G; Alshareef, HN; Ju, BS; Majhi, 2006 International Conference on Solid State Devices and Materials (SSDM 2006), pp.0 - 0, 2006-09-12 |
The effect of Ge composition and Si cap thickness on hot carrier reliability of Si/Si1-xGex/Si p-MOSFETs with high-K/metal gate Cho, Byung Jin; Loh, WY; Majhi, P; Lee, SH; Oh, JW; Sassman, B; Young, C; et al, 2008 Symposium on VLSI Technology, pp.56 - 57, 2008-06-17 |
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