Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Off-state stress (OSS)
Showing results 1 to 1 of 1
| Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,871 2020 - 2024
- 18,943 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989