Browse "School of Electrical Engineering(전기및전자공학부)" by Subject DATA RETENTION CHARACTERISTICS

Showing results 1 to 2 of 2

1
Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current

Lee, Jung-Woo; Han, Joon-Kyu; Kim, Myung-Su; Yu, Ji-Man; Jung, Jin-Woo; Yun, Seong-Yun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.11, pp.6133 - 6138, 2022-11

2
Statistical Characterization of Noise and Interference in NAND Flash Memory

Moon, Jaekyun; No, Jaehyeong; Lee, Sangchul; Kim, Sangsik; Choi, Seokhwan; Song, Yunheub, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.60, no.8, pp.2153 - 2164, 2013-08

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0