Browse "School of Electrical Engineering(전기및전자공학부)" by Subject DATA RETENTION CHARACTERISTICS
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| Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current Lee, Jung-Woo; Han, Joon-Kyu; Kim, Myung-Su; Yu, Ji-Man; Jung, Jin-Woo; Yun, Seong-Yun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.11, pp.6133 - 6138, 2022-11 |
| Statistical Characterization of Noise and Interference in NAND Flash Memory Moon, Jaekyun; No, Jaehyeong; Lee, Sangchul; Kim, Sangsik; Choi, Seokhwan; Song, Yunheub, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.60, no.8, pp.2153 - 2164, 2013-08 |
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