Browse "School of Electrical Engineering(전기및전자공학부)" by Author Shim, Seongbo

Showing results 12 to 23 of 23

12
Machine learning (ML)-based lithography optimizations

Shin, Youngsoo; Shim, Seongbo; Choi, Suhyeong, IEEE Asia Pacific Conference on Circuits and Systems, IEEE, 2016-10-25

13
Machine learning (ML)-guided OPC using basis functions of polar Fourier transform

Shim, Seongbo; Choi, Su Hyeong; Shin, Young Soo, SPIE Advanced Lithography, SPIE, 2016-02-24

14
Machine learning-based 3D resist model

Shim, Seongbo; Choi, Suhyeong; Shin, Youngsoo, SPIE Advanced Lithography, SPIE, 2017-02-26

15
Machine learning-based resist 3D model

Shim, Seongbo; Choi, Suhyeong; Shin, Youngsoo, Optical Microlithography XXX 2017, SPIE, 2017-02

16
Machine Learning-Guided Etch Proximity Correction

Shim, Seongbo; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.30, no.1, pp.1 - 7, 2017-02

17
Neural network classifier-based OPC with imbalanced training data

Choi, Suhyeong; Shim, Seongbo; Shin, Youngsoo, IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, v.38, no.5, pp.938 - 948, 2019-05

18
Physical design and mask synthesis for directed self-assembly lithography = 직접 자기조립 리소그라피를 위한 회로 설계 및 마스크 합성 연구link

Shim, Seongbo; 심성보; et al, 한국과학기술원, 2016

19
Placement optimization for MP-DSAL compliant layout

Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo, IEEE International Conference on IC Design and Technology (ICICDT), IEEE/ACM, 2016-06-27

20
Redundant via insertion for multiple-patterning directed-self-assembly lithography

Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo, 53rd Design Automation Conference (DAC), pp.41:1 - 41:6, ACM Special Interest Group on Design Automation (SIGDA), 2016-06-06

21
Synthesis of lithographic test patterns through topology-oriented pattern extraction and classification

Shim, Seongbo; CHUNG, WOOHYUN; Shin, Youngsoo, SPIE Advanced Lithography, pp.1 - 10, SPIE, 2014-02-25

22
Topology-oriented pattern extraction and classification for synthesizing lithography test patterns

Shim, Seongbo; Shin, Youngsoo, JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, v.14, no.1, 2015-01

23
Verification of Directed Self-Assembly (DSA) Guide Patterns through Machine Learning

Shim, Seongbo; Cai, Sibo; Yang, Seunghune; Choi, Jungdal; Shin, Youngsoo, Conference on Alternative Lithographic Technologies VII, SPIE, 2015-02-26

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