Browse "School of Electrical Engineering(전기및전자공학부)" by Subject silicidation
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| Dopant-Segregated Schottky Source/Drain FinFET With a NiSi FUSI Gate and Reduced Leakage Current Choi, Sung-Jin; Han, Jin-Woo; Kim, Sung-Ho; Moon, Dong-Il; Jang, Moon-Gyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, no.11, pp.2902 - 2906, 2010-11 |
| Sulfur effects in dopant-segregated schottky barrier (DSSB) junction = DSSB 접합에서의 S 이온 주입 효과 검증link Jang, Hyun-Jae; 장현재; et al, 한국과학기술원, 2014 |
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