Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 19401 to 19420 of 51608
| GANPU: An Energy-Efficient Multi-DNN Training Processor for GANs With Speculative Dual-Sparsity Exploitation Kang, Sanghoon; Han, Donghyeon; Lee, Juhyoung; Im, Dongseok; Kim, Sangyeob; Kim, Soyeon; Ryu, Junha; et al, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.56, no.9, pp.2845 - 2857, 2021-09 |
| Gap-mode Plasmon-Induced Photoresponse in Vertical Structure of Multilayer graphene Lee, Khang June; Choi, Sung-Yool, 2nd International Workshop on 2D Materials, 2nd International Workshop on 2D Materials, 2019-02-21 |
| GapFinder: Finding Inconsistency of Security Information From Unstructured Text Jo, Hyeonseong; Kim, Jinwoo; Porras, Phillip; Yegneswaran, Vinod; Shin, Seungwon, IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, v.16, no.1, pp.86 - 99, 2021-01 |
| GAPNet : generic-attribute-ppse network for fine-grained visual categorization using multi-attribute attention module = 세부 카테고리 분류를 위한 다중 특성 어텐션 모듈을 이용한 일반-특성-포즈 네트워크link Ju, Minjeong; Yoo, Changdong; et al, 한국과학기술원, 2020 |
| GAPNET: GENERIC-ATTRIBUTE-POSE NETWORK FOR FINE-GRAINED VISUAL CATEGORIZATION USING MULTI-ATTRIBUTE ATTENTION MODULE Ju, Minjeong; Ryu, Hobin; Moon, Sangkeun; Yoo, Chang-Dong, IEEE International Conference on Image Processing, ICIP 2020, pp.703 - 707, IEEE, 2020-09 |
| Gap‐Mode Plasmon‐Induced Photovoltaic Effect in a Vertical Multilayer Graphene Homojunction Lee, Khang June; Kwon, Kyungmok; Kim, Shinho; Hong, Woonggi; Park, Jung Hoon; Yu, Kyoungsik; Choi, Sung-Yool, ADVANCED OPTICAL MATERIALS, v.8, no.4, pp.1901519, 2020-02 |
| Gas Sensing with COTS RFID Devices Kim, Sunwoo; Kang, Hyunwoo; Kim, Song Min; Lee, Sung-Ju, the 17th Annual International Conference, pp.620 - 621, ACM Press, 2019-06-20 |
| Gas sensor platform with ring resonator Lim, Sungmook; Hong, Songcheol, 2017 Asia Pacific Microwave Conference, IEEE MTT-S, 2017-11 |
| Gas-Blast 차단기 내에서의 아크 플라즈마 소호 과정에 관한 연구 최경철; 황기웅, 전기학회논문지ABCD, v.42, no.5, pp.106 - 115, 1993-05 |
| Gas-phase etching of TEOS and PSG sacrifice layers using anhydrous HF and CH3OH Chung, HH; Jang, WI; Lee, CS; Lee, JH; Yoo, Hyung Joun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.30, no.3, pp.628 - 631, 1997-06 |
| GaSb/InAs Heterojunction-based UTB Tunnel FETs: A first principles study 조유철; 신민철; 장윤희, 제 26회 한국반도체학술대회, 제 26회 한국반도체학술대회, 2019-02-15 |
| Gate and functional level logic simulation with 8-state signal model = 8-상태의 신호 모델을 이용한 게이트 및 기능 레벨의 논리 시뮬레이션link Kweon, Tai-Wook; 권태욱; et al, 한국과학기술원, 1983 |
| Gate Bias Dependence of Substrate Signal Coupling Effect in RF MOSFETs Je, Minkyu; Shin, Hyung-Cheol, IEEE ELECTRON DEVICE LETTERS, v.24, no.3, pp.183 - 185, 2003-03 |
| Gate Controlled Diode를 이용한 HgCdTe의 표면재결합속도 측정 이희철; 최종화, 제6회 한국반도체 학술대회, pp.183 - 184, 1999 |
| Gate Controlled Diode를 이용한 HgCeTe Photodiode의 특성평가 Lee, Hee-Chul; Choi, Jong-Hwa, 새물리, v.41, no.4, pp.235 - 238, 2000-10 |
| Gate Delay Modeling for Static Timing Analysis of Body-Biased Circuits Baek, Donkyu; Ship, Insup; Shin, Youngsoo, IEEE International Conference on Integrated Circuit Design and Technology (ICICDT), IEEE, 2012-05-31 |
| Gate driving method for synchronous rectifiers in phase-shifted full-bridge converter Baek, Jae-Il; Kim, Chong-Eun; Lee, Jae-Bum; Youn, Han-Shin; Moon, Gun-Woo, Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, pp.753 - 758, IEEE, 2015-06-02 |
| Gate leakage current in double-gate MOSFETs with Si/SiO2 interface model from first principle calculations Park, Y.; Kong, K.-J.; Chang, H.; Shin, Mincheol, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, pp.1109 - 1112, IEEE, 2010-08-17 |
| Gate oxide damage from high dose implantation of hydrogen Choi, Yang-Kyu; Yun, C; Park, D; Cheung, N, the 13th International Conference on Ion Implantation Technology, 2000-09 |
| Gate oxide reliability concern associated with X-ray lithography Cho, Byung Jin; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, Extended Abstract of the 200 International Conf. on Solid State Devices and Materials (SSDM), pp.0 - 0, 2000-08-28 |
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