DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ko, Yong Ho | ko |
dc.contributor.author | Kim, Taek-Soo | ko |
dc.contributor.author | Bang, Jung-Hwan | ko |
dc.contributor.author | Lee, Chang-Woo | ko |
dc.date.accessioned | 2015-07-22T04:33:10Z | - |
dc.date.available | 2015-07-22T04:33:10Z | - |
dc.date.created | 2015-07-08 | - |
dc.date.issued | 2014-07-17 | - |
dc.identifier.citation | 67th IIW International Conference | - |
dc.identifier.uri | http://hdl.handle.net/10203/199953 | - |
dc.language | English | - |
dc.publisher | IIW | - |
dc.title | Joining Technology and Joint Reliability between Flexible Substrate and Si Chip with Micro-bump | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 67th IIW International Conference | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Sheraton Grande Walkerhill, Seoul | - |
dc.contributor.localauthor | Kim, Taek-Soo | - |
dc.contributor.nonIdAuthor | Bang, Jung-Hwan | - |
dc.contributor.nonIdAuthor | Lee, Chang-Woo | - |
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