DSpace at KOASAS: Bendel’s 2-parameter Modeling of SEU Cross Section for 0.35 ㎛ Shift Register

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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Bendel’s 2-parameter Modeling of SEU Cross Section for 0.35 ㎛ Shift Register

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Noh, Youngtak / Lee, Hee Chul researcher

Publisher: IEIE

Issue Date: 2014-11-04

Language: English

Citation: ISOCC(International SoC Design Conference) 2014

URI: http://hdl.handle.net/10203/192134

Appears in Collection: EE-Conference Papers(학술회의논문)

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Bendel’s 2-parameter Modeling of SEU Cross Section for 0.35 ㎛ Shift Register

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