Bendel’s 2-parameter Modeling of SEU Cross Section for 0.35 ㎛ Shift Register
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Noh, Youngtak | ko |
| dc.contributor.author | Lee, Hee Chul | ko |
| dc.date.accessioned | 2014-12-09 | - |
| dc.date.available | 2014-12-09 | - |
| dc.date.created | 2014-11-21 | - |
| dc.date.issued | 2014-11-04 | - |
| dc.identifier.citation | ISOCC(International SoC Design Conference) 2014 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/192134 | - |
| dc.language | English | - |
| dc.publisher | IEIE | - |
| dc.title | Bendel’s 2-parameter Modeling of SEU Cross Section for 0.35 ㎛ Shift Register | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ISOCC(International SoC Design Conference) 2014 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Ramada Plaza, Jeju Island | - |
| dc.contributor.localauthor | Lee, Hee Chul | - |
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