DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, IkJin | - |
dc.contributor.author | Choi, Kyung K | - |
dc.contributor.author | David, Gorsich | - |
dc.date.accessioned | 2014-08-28T05:03:11Z | - |
dc.date.available | 2014-08-28T05:03:11Z | - |
dc.date.created | 2014-06-23 | - |
dc.date.issued | 2011-08-29 | - |
dc.identifier.citation | ASME IDETC/DAC, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/187869 | - |
dc.language | ENG | - |
dc.publisher | ASME | - |
dc.title | Equivalent Standard Deviation to Convert High-Reliability Model to Low-Reliability Model for Efficiency of Sampling-Based RBDO | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | ASME IDETC/DAC | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Lee, IkJin | - |
dc.contributor.nonIdAuthor | Choi, Kyung K | - |
dc.contributor.nonIdAuthor | David, Gorsich | - |
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