A Bandgap-Engineered Silicon-Germanium Biristor for Low-Voltage Operation

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A bandgap-engineered silicon-germanium biristor for low-voltage operation is investigated through numerical simulations. A reduced latch-up voltage is achieved using germanium as a base, and improved hysteresis is attained by adopting a hetero-bandgap structure which harnesses the silicon-germanium composite at the collector/emitter. The geometric parameters of the base length and base diameter are optimized. The proposed device shows a much lower latch-up voltage than a pure-silicon biristor and larger hysteresis than a pure-germanium biristor. Thus, the proposed bandgap-engineered silicon-germanium biristor is preferable for low-voltage operations.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2014-01
Language
English
Article Type
Article
Keywords

BIPOLAR-TRANSISTORS; DEPENDENCE; 1T-DRAM; REGION

Citation

IEEE TRANSACTIONS ON ELECTRON DEVICES, v.61, no.1, pp.2 - 7

ISSN
0018-9383
DOI
10.1109/TED.2013.2288272
URI
http://hdl.handle.net/10203/187268
Appears in Collection
EE-Journal Papers(저널논문)
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