Transmission electron microscopy study of $ZnO/Al_{2}O_{3}$ based thin film transistor grown by atomic layer deposition methodALD 방법으로 증착된 $ZnO/Al_{2}O_{3}$ 기반 박막형 트랜지스터의 투과전자현미경 연구

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dc.contributor.advisorLee, Jeong-Yong-
dc.contributor.advisor이 정 용-
dc.contributor.authorJang, Yong-Woon-
dc.contributor.author장용운-
dc.date.accessioned2013-09-12T04:42:38Z-
dc.date.available2013-09-12T04:42:38Z-
dc.date.issued2011-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=482603&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/181956-
dc.description학위논문(박사) - 한국과학기술원 : 신소재공학과, 2011.8, [ xii, 158 p. ]-
dc.languageeng -
dc.publisher한국과학기술원-
dc.subjectZnO-
dc.subjectatomic layer deposition-
dc.subjecthigh-k dielectric material-
dc.subjectZnAl2O4-
dc.subject원자층증착법-
dc.subjectZnO-
dc.subject고유전율재료-
dc.subjectZnAl2O4-
dc.subject박막형 트랜지스터-
dc.subjectthin film transistor-
dc.titleTransmission electron microscopy study of $ZnO/Al_{2}O_{3}$ based thin film transistor grown by atomic layer deposition method-
dc.title.alternativeALD 방법으로 증착된 $ZnO/Al_{2}O_{3}$ 기반 박막형 트랜지스터의 투과전자현미경 연구-
dc.typeThesis(Ph.D)-
dc.identifier.CNRN482603/325007 -
dc.description.department한국과학기술원 : 신소재공학과, -
dc.identifier.uid020075155-
dc.contributor.localauthorLee, Jeong-Yong-
dc.contributor.localauthor이 정 용-
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MS-Theses_Ph.D.(박사논문)
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