Showing results 1 to 10 of 10
A STUDY OF LATTICE DAMAGE IN SILICON INDUCED BY BF2+ ION-IMPLANTATION PAEK, MC; KWON, OJ; Lee, JeongYong; Lim, Ho Bin, JOURNAL OF APPLIED PHYSICS, v.70, no.8, pp.4176 - 4180, 1991-10 |
EFFECT OF HYDROGEN IN THE SELENIZING ATMOSPHERE ON THE PROPERTIES OF CUINSE2 THIN-FILMS Park, JW; Chung, GY; Ahn, Byung Tae; Lim, Ho Bin; Song, JS, THIN SOLID FILMS, v.245, no.1-2, pp.174 - 179, 1994-06 |
EFFECTS OF ANNEALING CONDITIONS ON THE PROPERTIES OF TANTALUM OXIDE-FILMS ON SILICON SUBSTRATES PARK, SW; BAEK, YK; Park, Chong-Ook; PARK, CO; Lim, Ho Bin, JOURNAL OF ELECTRONIC MATERIALS, v.21, no.6, pp.635 - 639, 1992-06 |
EFFECTS OF ANNEALING ON THE DAMAGE MORPHOLOGIES IN BF2+ ION-IMPLANTED (100)SILICON PAEK, MC; Lim, Ho Bin; Lee, JeongYong, JOURNAL OF MATERIALS SCIENCE, v.26, no.10, pp.2603 - 2607, 1991-05 |
EFFECTS OF MORPHOLOGIES OF (CD+TE) POWDERS ON THE PROPERTIES OF SINTERED CDS/CDTE SOLAR-CELLS Kim, DS; Kim, SY; Ahn, Byung Tae; Lim, Ho Bin, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.5, no.1, pp.17 - 21, 1994 |
ELECTRICAL AND OPTICAL-PROPERTIES OF VACUUM-EVAPORATED CDS FILMS KIM, SY; KIM, DS; Ahn, Byung Tae; Lim, Ho Bin, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.4, no.2, pp.178 - 182, 1993-06 |
PHOTOVOLTAIC PROPERTIES OF SINTERED CDS/CDTE SOLAR-CELLS DOPED WITH CU Park, JW; Ahn, Byung Tae; Lim, Ho Bin; Kim, CS, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.139, no.11, pp.3351 - 3356, 1992-11 |
PROPERTIES OF CDS FILMS PREPARED BY THE CHEMICAL MIST DEPOSITION PROCESS CHUNG, GY; KIM, HD; Ahn, Byung Tae; Lim, Ho Bin, THIN SOLID FILMS, v.232, no.1, pp.28 - 33, 1993-09 |
RECRYSTALLIZATION OF LPCVD AMORPHOUS SI FILMS USING F+ IMPLANTATION PARK, JW; MOON, DG; Ahn, Byung Tae; Lim, Ho Bin; Lee, Kwyro, THIN SOLID FILMS, v.245, no.1-2, pp.228 - 233, 1994-06 |
STRUCTURAL AND OPTICAL-PROPERTIES OF MICROCRYSTALLINE SILICON FILMS DEPOSITED BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION Moon, DG; Jung, BH; Lee, JN; Ahn, Byung Tae; Lim, Ho Bin; Nam, KS; Kang, SW, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.5, no.6, pp.364 - 369, 1994 |
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