Showing results 1 to 2 of 2
Annihilation Behavior of Planar Defects on Phosphorus-Doped Silicon at Low Temperatures Im, Dong Hyun; Kim, Yong In; Jeong, Myoungho; Park, Kwang Wuk; Kim, Sung Kyu; Yuk, Jong Min; Nam, Woo Hyun; et al, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.5, pp.3370 - 3374, 2017-05 |
Interfacial Layer Control by Dry Cleaning Technology for Polycrystalline and Single Crystalline Silicon Growth Im, Dong-Hyun; Lee, Kong-Soo; Kang, Yoongoo; Jeong, Myoungho; Park, Kwang Wuk; Lee, Soon-Gun; Ma, Jin-Won; et al, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.5, pp.4906 - 4913, 2016-05 |
Discover