Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject FORCE MICROSCOPY
Showing results 1 to 16 of 16
| Characterization of sensitivity and resolution of silicon resistive probe Kim, Junsoo; Lee, Jaehong; Song, Ickhyun; Lee, Jong Duk; Park, Byung-Gook; Hong, Seungbum; Ko, Hyoungsoo; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.3, pp.1717 - 1722, 2008-03 |
| Charge gradient microscopy Hong, Seungbum; Tong, Sheng; Park, Woon Ik; Hiranaga, Yoshiomi; Cho, Yasuo; Roelofs, Andreas, PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.111, no.18, pp.6566 - 6569, 2014-05 |
| Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films Kim, Yun-Seok; Park, Moon-Kyu; Buehlmann, Simon; Hong, Daniel Seungbum; Kim, Yong-Kwan; Ko, Hyoung-Soo; Kim, Ji-Yoon; et al, JOURNAL OF APPLIED PHYSICS, v.107, no.5, 2010-03 |
| Evidence for forward domain growth being rate-limiting step in polarization switching in < 111 >-oriented-Pb(Zr0.45Ti0.55)O-3 thin-film capacitors Hong, SB; Setter, N, APPLIED PHYSICS LETTERS, v.81, no.18, pp.3437 - 3439, 2002-10 |
| Fabrication and characterization of Pb(ZrTi)O(3) (PZT) ultra-thin films below 100nm Hong, J; Song, HW; Hong, Daniel Seungbum; Shin, HJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1647 - 1652, 2002 |
| Formation and process optimization of scanning resistive probe Shin, Hyunjung; Kim, Chanhyung; Lee, Bongki; Kim, Jiyoung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; et al, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.24, no.5, pp.2417 - 2420, 2006-09 |
| Grain/domain interaction antd its effect on bit formation in ferroelectric films Kim, Yunseok; Hong, Daniel Seungbum; Park, Hongsik; Kim, Seung-Hyun; Min, Dong-Ki; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.78, pp.255 - 260, 2006 |
| High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O-3 ferroelectric thin film capacitors Hong, Daniel Seungbum; Colla, EL; Kim, E; Taylor, DV; Tagantsev, AK; Muralt, P; No, Kwangsoo; et al, JOURNAL OF APPLIED PHYSICS, v.86, no.1, pp.607 - 613, 1999-07 |
| Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography Hruszkewycz, S. O.; Highland, M. J.; Holt, M. V.; Kim, Dongjin; Folkman, C. M.; Thompson, Carol; Tripathi, A.; et al, PHYSICAL REVIEW LETTERS, v.110, no.17, 2013-04 |
| Injection charge assisted polarization reversal in ferroelectric thin films Kim, Yun-Seok; Buhlmann, S; Hong, Daniel Seungbum; Kim, SH; No, Kwangsoo, APPLIED PHYSICS LETTERS, v.90, pp.2800 - 2804, 2007-02 |
| Local surface potential distribution and its relaxation in ferroelectric poly(vinylidenefluoride-co-trifluoroethylene) thin films Choi, Hyun-Woo; Hong, Jong-In; No, Kwang-Soo, APPLIED PHYSICS LETTERS, v.101, no.4, 2012-07 |
| Local surface potential distribution in oriented ferroelectric thin films Kim, Yun-Seok; Buehlmann, Simon; Kim, Ji-Yoon; Park, Moon-Kyu; No, Kwang-Soo; Kim, Yong-Kwan; Hong, Daniel Seungbum, APPLIED PHYSICS LETTERS, v.91, pp.1051 - 1056, 2007-07 |
| Retention loss phenomena in hydrothermally fabricated heteroepitaxial PbTiO3 films studied by scanning probe microscopy Ahn, WS; Jung, WW; Choi, Si-Kyung; Cho, Y, APPLIED PHYSICS LETTERS, v.88, no.8, pp.869 - 875, 2006-02 |
| Screen charge transfer by grounded tip on ferroelectric surfaces Kim, Yun-Seok; Kim, Ji-Yoon; Buhlmann, Simon; Hong, Daniel Seungbum; Kim, Yong-Kwan; Kim, Seung-Hyun; No, Kwang-Soo, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.2, pp.74 - 76, 2008-03 |
| The effect of nitrogen incorporation on surface properties of silicon oxynitride films Hong, Jongin; Kim, Yunseok; Paik, Hanjong; No, Kwangsoo; Lukes, Jennifer R, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.3, pp.25 - 27, 2009-01 |
| Visualization of Functional Components in a Lithium Silicon Titanium Phosphate-Natural Graphite Composite Anode Kim, Hongjun; Oh, Jimin; Park, Gun; Jetybayeva, Albina; Kim, Jaegyu; Lee, Young-Gi; Hong, Seungbum, ACS APPLIED ENERGY MATERIALS, v.3, no.4, pp.3253 - 3261, 2020-03 |
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