Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films

Cited 23 time in webofscience Cited 0 time in scopus
  • Hit : 396
  • Download : 355
We have studied the effect of local surface potential distribution on its relaxation in the polycrystalline ferroelectric thin films. A lower surface potential region, i.e., potential pit, is generated near a grain boundary. The deep potential pit has a faster relaxation than the area far away from the potential pit due to the acceleration of the screen charge draining near the grain boundary and the domains formed by applying higher voltage have a faster relaxation due to the larger gradient of screen charge distribution. In addition, the surface potential and its relaxation depend on the sign of applying voltage. The result shows that the surface potential distribution may influence significantly to the reliability of bit signal on the memory devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3290953]
Publisher
AMER INST PHYSICS
Issue Date
2010-03
Language
English
Article Type
Article
Keywords

THIN-FILMS; PROBE MICROSCOPY; FORCE MICROSCOPY; CHARGE

Citation

JOURNAL OF APPLIED PHYSICS, v.107, no.5

ISSN
0021-8979
DOI
10.1063/1.3290953
URI
http://hdl.handle.net/10203/99095
Appears in Collection
MS-Journal Papers(저널논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 23 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0