Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Author Pak, YE

Showing results 1 to 6 of 6

1
A dielectric biosensor using the capacitance change with AC frequency integrated on glass substrates

Hong, J; Yoon, DS; Park, M; Choi, J; Kim, TS; Im, G; Kim, S; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.43, pp.5639 - 5645, 2004-08

2
Data Storage Systems Based on Atomic Force Microscopy

No, Kwangsoo; Shin, H; Hong, S; Woo, J; Jeon, JU; Pak, YE, The joint symposium of the Asian Symposium on Organized Molecular Films for Electronics and Photonics and the 11th Molecular Electronics and Devices Symposium, pp.O-4 -, 2000-07-10

3
Effect of metal-insulator-semiconductor structure derived space charge field on the tip vibration signal in electrostatic force microscopy

Hong, Daniel Seungbum; Woo, JW; Shin, HJ; Kim, E; Kim, KH; Jeon, JU; Pak, YE; et al, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.18, no.6, pp.2688 - 2691, 2000

4
Principle of ferroelectric domain imaging using atomic force microscope

Hong, Daniel Seungbum; Woo, J; Shin, H; Jeon, JU; Pak, YE; Colla, EL; Setter, N; et al, JOURNAL OF APPLIED PHYSICS, v.89, no.2, pp.1377 - 1386, 2001-01

5
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14

6
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, Daniel Seungbum; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001

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