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Showing results 4 to 6 of 6

4
Principle of ferroelectric domain imaging using atomic force microscope

Hong, Daniel Seungbum; Woo, J; Shin, H; Jeon, JU; Pak, YE; Colla, EL; Setter, N; et al, JOURNAL OF APPLIED PHYSICS, v.89, no.2, pp.1377 - 1386, 2001-01

5
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14

6
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, Daniel Seungbum; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001

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