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Factors Determining the Resistive Switching Behavior of Transparent InGaZnO-Based Memristors Qin, Fei; Zhang, Yuxuan; Park, Honghwi; Kim, Chung Soo; Lee, Dong Hun; Jiang, Zhong-Tao; Park, Jeongmin; et al, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.16, no.7, 2022-07 |
Low-temperature metal/Zerodur heterogeneous bonding through gas-phase processed adhesion promoting interfacial layers Klokkevold, Katherine N.; Keeven, Weston; Lee, Dong Hun; Clevenger, Michael; Liu, Mingyuan; No, Kwangsoo; Song, Han Wook; et al, AIP ADVANCES, v.12, no.10, 2022-10 |
The Effect of Bias Stress on the Performance of Amorphous InAlZnO-Based Thin Film Transistors Liu, Mingyuan; Qin, Fei; Rothschild, Molly; Zhang, Yuxuan; Lee, Dong Hun; No, Kwangsoo; Song, Han Wook; et al, JOURNAL OF ELECTRONIC MATERIALS, v.51, no.4, pp.1813 - 1819, 2022-04 |
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