Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Author Kang, Sang-Won

Showing results 49 to 108 of 126

49
Characterization of $TiO_2$ thin films formed by plasma enhanced atomic layer deposition = PEALD법을 이용한 $TiO_2$ 박막 증착 및 특성에 관한 연구link

Park, Pan-Kwi; 박판귀; et al, 한국과학기술원, 2002

50
CMP의 기계적 공정 변수가 반도체 표면 평탄화의 균일도에 미치는 영향 = A effect of the mechanical factors on the uniformity in the chemical-mechanical polishing(CMP) of $SiO_2$ thin filmlink

김우찬; Kim, Woo-Chan; et al, 한국과학기술원, 1996

51
Comparison of Tantalum Nitride Films for Different NH3/H-2/Ar Reactant States in Two-Step Atomic Layer Deposition

Kwon, Jung-Dae; Yun, Jungheum; Kang, Sang-Won, JAPANESE JOURNAL OF APPLIED PHYSICS, v.48, no.2, 2009

52
Controlling the composition of Ti1–xAlxN thin films by modifying the number of TiN and AlN subcycles in atomic layer deposition

Lee, Yong Ju; Kang, Sang-Won, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.21, no.5, pp.L13 - L15, 2003-08

53
Controlling the temperature coefficient of resistance and resistivity in RuO2-TiO2 thin films by the intermixing ratios between RuO2 and TiO2

Kwon, Se-Hun; Kang, Sang-Won; Kim, Kwang-Ho, APPLIED PHYSICS LETTERS, v.92, no.18, 2008-05

54
Cycle-CVD법을 이용한 tantalum oxide 원자층 단위 증착 및 특성에 관한 연구 = A study on atomic layer deposition and film characteristics of tantalum oxide using cycle-CVDlink

송현정; Song, Hyun-Jung; et al, 한국과학기술원, 1998

55
Cyclic CVD 법으로 증착된 TiN 박막의 증착 기구와 특성에 관한 연구 = A study on deposition mechanism and characteristics of TiN thin films deposited by Cyclic CVDlink

손영웅; Sohn, Young-Woong; et al, 한국과학기술원, 1997

56
Effect of crystallinity and nonstoichiometric region on dielectric properties of SrTiO3 films formed on Ru

Kim, Ja-Yong; Ahn, Ji-Hoon; Kang, Sang-Won; Kim, Jin-Hyock; Roh, Jae-Sung, APPLIED PHYSICS LETTERS, v.91, no.9, 2007-08

57
Effect of Sr-ruthenate seed layer on dielectric properties of SrTiO3 thin films prepared by plasma-enhanced atomic layer deposition

Ahn, Ji-Hoon; Kang, Sang-Won; Kim, Ja-Yong; Kim, Jin-Hyock; Roh, Jae-Sung, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.10, pp.G185 - G188, 2008-08

58
Enhanced Dielectric Properties of SrTiO3 Films with a SrRuO3 Seed by Plasma-Enhanced Atomic Layer Deposition

Ahn, Ji-Hoon; Kim, Ja-Yong; Kim, Jin-Hyock; Roh, Jae-Sung; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.12, no.2, pp.G5 - G8, 2009

59
Enhancement of dielectric constant in HfO2 thin films by the addition of Al2O3

Park, Pan Kwi; Kang, Sang-Won, APPLIED PHYSICS LETTERS, v.89, no.19, 2006-11

60
Enhancement of iodine adsorption on ruthenium glue layer for seedless CECVD of Cu

Lee, HB; Kwak, DK; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.8, no.2, pp.C39 - C42, 2005

61
Enhancement of Iodine Adsorption Using I2 Plasma for Seedless Catalyst-Enhanced CVD of Copper

Kwon, Oh-Kyum; Kim, Jae-Hoon; Park, Hyoung-Sang; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.6, no.8, pp.109 - 111, 2003-06

62
Enhancement of the film growth rate by promoting iodine adsorption in the catalyst-enhanced chemical vapor deposition of Cu

Kwon, OK; Lee, HB; Kang, Sang-Won; Park, HS, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A, v.20, no.2, pp.408 - 412, 2002

63
Enhancement of the TiO2 Thin-Film Dielectric Constant Through Pretreatment of Ir Substrate

Joo, Dae-Kwon; Park, Jin-Seong; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.12, no.3, pp.H77 - H79, 2009

64
Fabrication and Electrochemical Characterization of TiO2 Three-Dimensional Nanonetwork Based on Peptide Assembly

Kim, Sung-Wook; Han, Tae Hee; Kim, Jongsoon; Gwon, Hyeokjo; Moon, Hyoung-Seok; Kang, Sang-Won; Kim, Sang Ouk; et al, ACS NANO, v.3, no.5, pp.1085 - 1090, 2009-05

65
Formation of TiO2 thin films using NH3 as catalyst by metalorganic chemical vapor deposition

Jung, Sung-Hoon; Kang, Sang-Won, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1, v.40, no.5A, pp.3147 - 3152, 2001-05

66
Growth mechanism and diffusion barrier property of plasma-enhanced atomic layer deposition Ti-Si-N thin films

Park, JS; Kang, Sang-Won; Kim, H, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.24, no.3, pp.1327 - 1332, 2006

67
Growth of aluminum nitride thin films prepared by plasma-enhanced atomic layer deposition

Lee, YJ; Kang, Sang-Won, THIN SOLID FILMS, v.446, no.2, pp.227 - 231, 2004-01

68
High efficiency heating resistor comprising an oxide, liquid ejecting head and apparatus using the same

Kang, Sang-Won; Kwon, Se-Hun

69
Improvement of copper diffusion barrier properties of tantalum nitride films by incorporating ruthenium using PEALD

Kim, Sung-Wook; Kwon, Se-Hun; Jeong, Seong-Jun; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.11, pp.H885 - H888, 2008-09

70
Improvement of morphological stability of PEALD-iridium thin films by adopting two-step annealing process

Kim, Sung-Wook; Kwon, Se-Hun; Jeong, Seong-Jun; Park, Jin-Seong; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.11, no.11, pp.H303 - H305, 2008-09

71
Improvement of Surface Morphology of Aluminum Thin Films Grown by Metallorganic Chemical Vapor Deposition

Ahn, Seong-Deok; Lee, Hyun-Bae; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.3, no.4, pp.186 - 188, 2000-04

72
Improvement of the dielectric properties of Ta2O5 and SiO2 based laminated materials

Kang, Sang-Won, Atomic Layer Deposition 2002, ALD, 2002-08

73
Improvement of the morphological stability by stacking RuO2 on ru thin films with atomic layer deposition

Kwon, Se-Hun; Kwon, Oh-Kyum; Kim, Jae-Hoon; Jeong, Seong-Jun; Kim, Sung-Wook; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.154, no.9, pp.H773 - H777, 2007

74
Increment of dielectric properties of SrTiO3 thin films by SrO interlayer on Ru bottom electrodes

Ahn, Ji-Hoon; Kim, Ja-Yong; Kang, Sang-Won, APPLIED PHYSICS LETTERS, v.91, no.6, 2007-08

75
Increment of the Dielectric Constant of Ta2O5 Thin Films by Retarding Interface Oxide Growth on Si Substrates

Song, Hyun-Jung; Lee, Choon-Soo; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.4, no.7, pp.F13 - F14, 2001-07

76
Influence of substrate bias voltage on structure and properties of Cr-Mo-Si-N coatings prepared by a hybrid coating system

Hong, Seung Gyun; Kwon, Se-Hun; Kang, Sang-Won; Kim, Kwang Ho, SURFACE & COATINGS TECHNOLOGY, v.203, no.5-7, pp.624 - 627, 2008-12

77
Initial stages of ruthenium film growth in plasma-enhanced atomic layer deposition

Kwon, Se-Hun; Kwon, Oh-Kyum; Kim, Jin-Hyock; Oh, Heung-Ryong; Kim, Kwang-Ho; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.5, pp.H296 - H300, 2008-03

78
Interface effect on dielectric constant of HfO2/Al 2O3 nanolaminate films deposited by plasma-enhanced atomic layer deposition

Park, Pan Kwi; Cha, Eun-Soo; Kang, Sang-Won, APPLIED PHYSICS LETTERS, v.90, no.23, pp.232906, 2007-06

79
Interfacial reaction in the sputter-deposited SiO2/Ti0.1W0.9 antifuse system

Baek, Jong Tae; Park, Hyung-Ho; Cho, Kyung-Ik; Yoo, Hyung Joun; Kang, Sang-Won; Ahn, Byung Tae, JOURNAL OF APPLIED PHYSICS, v.78, no.12, pp.7074 - 7079, 1995-12

80
Investigation of link formation in a novel planar-type antifuse structure

Baek, Jong Tae; Park, Hyung-Ho; Kang, Sang-Won; Ahn, Byung Tae; Yoo, Hyung Joun, THIN SOLID FILMS, v.288, no.1-2, pp.41 - 44, 1996-11

81
Investigation of link formation in a novel planar-type antifuse structure

Baek, Jong Tae; Park, Hyung-Ho; Kang, Sang-Won; Ahn, Byung Tae; Yoo, Ilyung, Thin Solid Films, 288, 41-44, 1996-02-20

82
Investigation of link formation in a novel planar-type antifuse structure

Baek, Jong Tae; Park, Hyung-Ho; Kang, Sang-Won; Ahn, Byung Tae; Yoo, Hyung-Joun, Thin Solid Films 288 (1996) 41--44, 1996-02

83
Kinetic model for cavity filling in CECVD of copper = 촉매 처리에 의한 구리 CECVD의 cavity filling 현상에 관한 모델link

Lee, Hyun-Bae; 이현배; et al, 한국과학기술원, 2005

84
Kinetic Modeling for Multi-Component Thin Film Growth in Plasma Enhanced Atomic Layer Deposition

Kang, Sang-Won, 203rd ECS Meeting, ECS, 2003-04

85
Kinetic modeling of film growth rates of TiN films in atomic layer deposition

Lim, Jung-Wook; Park, Jin-Seong; Kang, Sang-Won, JOURNAL OF APPLIED PHYSICS, v.87, no.9, pp.4632 - 4634, 2000-05

86
Measurement of thermal expansion coefficient of poly-Si using microgauge sensors

Chae, Jung-Hun; Lee, Jae-Youl; Kang, Sang-Won, SPIE Vol. 3242, pp.202-211, 1997

87
Measurement of thermal expansion coefficient of poly-Si using microgauge sensors

Chae, JH; Lee, JY; Kang, Sang-Won, SENSORS AND ACTUATORS A-PHYSICAL, v.75, no.3, pp.222 - 229, 1999-06

88
Metalorganic chemical vapor deposition of copper on ruthenium thin film

Kwak, Dong-Kee; Lee, Hyun-Bae; Han, Jae-Won; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.9, no.10, pp.C171 - C173, 2006

89
Metal–organic atomic-layer deposition of titanium–silicon–nitride films

Min, Jae-Sik; Park, Hyung-Sang; Kang, Sang-Won, APPLIED PHYSICS LETTERS 99 75(11) 1521-1523, 1999-07-19

90
Optimizing electrical and mechanical properties of reaction-sintered SiC by using different-sized SiC particles in preform

Jeon Y.-S.; Shin H.; Park J.-S.; Kang, Sang-Won, 한국세라믹학회지, v.45, no.8, pp.439 - 442, 2008

91
Phase control of iridium and iridium oxide thin films in atomic layer deposition

Kim, Sung-Wook; Kwon, Se-Hun; Kwak, Dong-Kee; Kang, Sang-Won, JOURNAL OF APPLIED PHYSICS, v.103, no.2, 2008-01

92
Plasma enhanced atomic layer deposition of transition metal nitrides (Invited talk)

Kang, Sang-Won, Atomic Layer Deposition conference, ALD, 2001-05

93
Plasma-Enhanced Atomic Layer Deposition of Aluminum Grown by a Sequential Supply of TMA and H2

Kang, Sang-Won, 3rd International AVS Conference on Microelectronics and Interfaces, ICMI, 2002-02

94
Plasma-enhanced atomic layer deposition of Ta-N thin films

Park, JS; Park, HS; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.149, no.1, pp.28 - 32, 2002-01

95
Plasma-enhanced atomic layer deposition of TaN thin films using tantalum-pentafluoride and N-2/H-2/Ar plasma

Chung, Hoi-Sung; Kwon, Jung-Dae; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.153, no.11, pp.C751 - C754, 2006

96
Plasma-enhanced atomic layer deposition of tantalum nitrides using hydrogen radicals as a reducing agent

Park, JS; Lee, MJ; Lee, CS; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.4, no.4, pp.17 - 19, 2001-04

97
Reduced electrical resistivity of reaction-sintered SiC by nitrogen doping

Jeon, Young-Sam; Shin, Hyunho; Lee, Young-Hyun; Kang, Sang-Won, JOURNAL OF MATERIALS RESEARCH, v.23, no.4, pp.1020 - 1025, 2008-04

98
Reduction of Leakage Current at the Gate Edge of SDB SO1 NMOS Transistor

Kang, Sung-Weon; Lyu, Jong-Son; Kang, Jin-Young; Kang, Sang-Won; Lee, Jin-Hyo, IEEE ELECTRON DEVICE LETTERS, v.16, no.6, pp.236 - 236, 1995-06

99
Slurry thickness에 따른 CMP modeling에 관한 연구 = A study on the modeling of chemical-mechanical polishing (CMP) depending on slurry thicknesslink

김우찬; Kim, Woo-Chan; et al, 한국과학기술원, 2003

100
Step coverage modeling of thin films in atomic layer deposition

Kim, Ja-Yong; Ahn, Ji-Hoon; Kang, Sang-Won; Kim, Jin-Hyock, JOURNAL OF APPLIED PHYSICS, v.101, no.7, 2007-04

101
Studies on Microvoids at the Interface of Direct Bonded Silicon Wafers

Yun, Sun-Jin; Ahn, Kun-Young; Yi, Kyoung-Soo; Kang, Sang-Won, Journal of The Electrochemical Society, 139(8), 2326-2330, 1992-08

102
STUDIES ON MICROVOIDS AT THE INTERFACE OF DIRECT BONDED SILICON-WAFERS

Yun, Sun-Jin; Ahn, Kun-Young; Yi, Kyoung-Soo; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.139, no.8, pp.2326 - 2330, 1992-08

103
A Study of Cu Metal Deposition on Amorphous Si Film from Cu solution for Low-Temperature Crystallization of Amorphous Si Films

Sohn, Dong-Hyun; Lee, Jeong No; Kang, Sang-Won; Ahn, Byung Tae, Journal of The Electrochemical Society, vol.144, no.10, pp.3592-3596, 1997-07-01

104
Study of Interaction between Incident Silicon and Germanium Fluxes and SiO2 Layer Using Solid-Source Molecular Beam Epitaxy

Yun, Sun-Jin; Lee, Seung-Chang; Kim, Bo-Woo; Kang, Sang-Won, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.12, no.2, pp.1167 - 1169, 1994-03

105
Surface morphology improvement of metalorganic chemical vapor deposition Al films by layered deposition of Al and ultrathin TiN

Ahn, Seong-Deok; Lee, Hyun-Bae; Kang, Sang-Won, JAPANESE JOURNAL OF APPLIED PHYSICS, v.39, no.6A, pp.3349 - 3354, 2000-06

106
The Characteristics of tantalum nitride films Deposited by plasma enhanced atomic layer deposition using hydrogen radical as reduced agent

Kang, Sang-Won, The Second Asian Conference on Chemical Vapor Deposition, Asian Conference on Chemical Vapor Deposition, 2001-05

107
THE EFFECT OF AMORPHOUS-SILICON CAPPING ON TITANIUM DURING TISI2 FORMATION BY RTA

Kang, Sang-Won; Park, Sin Chong; Chun , Soung Soon, JOURNAL OF MATERIALS SCIENCE, v.25, no.1A, pp.98 - 102, 1990-01

108
The Mechanism of Si Incorporation and the Digital Control of Si Content during the Metallorganic Atomic Layer Deposition of Ti-Si-N Thin Films

Min, Jae-Sik; Park, Jin-Seong; Park, Hyung-Sang; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.147, no.10, pp.3868 - 3872, 2000-06

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