Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Type Article
Showing results 4121 to 4140 of 7255
| MBE로 성장시킨 GaAs/AL0.3Ga0.7As층의 고분해능 투과전자현미경에 의한 연구 이정용, 전자공학회논문지, v.26, no.8, pp.76 - 83, 1989-12 |
| MBE로 성장한 대칭적으로 변형된 Si/Ge 단원자층 초격자의 특성 우용득; 김문덕; 한명수; 손윤; 강태원; 이정용, 새물리, v.32, no.5, pp.715 - 719, 1992-12 |
| Measurement and Analysis for Residual Warpage of Chip-on-Flex (COF) and Chip-in-Flex (CIF) Packages Jang, Jae-Won; Suk, Kyoung-Lim; Paik, Kyung-Wook; Lee, Soon-Bok, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.2, no.5, pp.834 - 840, 2012-05 |
| Measurement and calculation of optical band gap of chromium aluminum oxide films Kim, E; Jiang, ZT; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.8, pp.4820 - 4825, 2000-08 |
| Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM) Shin, Hyunjung; Lee, Bongki; Kim, Chanhyung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; Hong, Seungbum; et al, ELECTRONIC MATERIALS LETTERS, v.1, no.2, pp.127 - 133, 2005-12 |
| Measurement of Acoustic Properties of polyurethane by the through Transmission Method 김태식; 이기석; 안봉영; 이진형, 한국음향학회지, v.19, no.1, pp.40 - 47, 2000 |
Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films Roy, Shrawan; Sharbirin, Anir S.; Lee, Yongjun; Kim, Won Bin; Kim, Tae Soo; Cho, Kiwon; Kang, Kibum; et al, NANOMATERIALS, v.10, no.6, 2020-06 |
| Measurement of reduction kinetics in Nb2O5-doped SrTiO3 by use of a new technique of liquid film migration Koo, SY; Lee, GG; Kang, Suk-Joong L, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.66, pp.498 - 503, 2005-02 |
| Measurement of residual stress in diamond films obtained using chemical vapor deposition Kim, JG; Yu, Jin, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.37, no.7B, pp.890 - 893, 1998-07 |
| Measurement of the differential Pockels and Kerr coefficients of thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Mendieta, FJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1911 - 1916, 2002 |
| Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, Pyuck-Pa; Raabe, D.; Hoffmann, L.; Joenen, H.; et al, APPLIED PHYSICS LETTERS, v.102, no.13, 2013-04 |
| Measurement of the linear electro-optic coefficients of sol-gel derived strontium barium niobate thin films using a two-beam polarization interferometer Koo, J; Lee, C; Jang, JH; No, Kwangsoo; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.76, no.19, pp.2671 - 2673, 2000-05 |
| Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Lee, C; No, Kwangsoo, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.15, no.7, pp.1940 - 1946, 1998-07 |
| Measurement of the quadratic electrooptic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer Spirin, VV; Lee, CH; No, Kwangsoo, OPTICS COMMUNICATIONS, v.158, no.1-6, pp.239 - 249, 1998-12 |
| Measurement of the thermo-optic coefficients in sol-gel derived inorganic-organic hybrid material films Kang, Eun-Seok; Lee, Tae-Ho; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.81, no.8, pp.1438 - 1440, 2002-08 |
| Measurement of thermal expansion coefficient of poly-Si using microgauge sensors Chae, Jung-Hun; Lee, Jae-Youl; Kang, Sang-Won, SPIE Vol. 3242, pp.202-211, 1997 |
| Measurement of thermal expansion coefficient of poly-Si using microgauge sensors Chae, JH; Lee, JY; Kang, Sang-Won, SENSORS AND ACTUATORS A-PHYSICAL, v.75, no.3, pp.222 - 229, 1999-06 |
| Measurement of thermo-optic coefficients in sol-gel hybrid glass films Kang, ES; Bae, JY; Bae, Byeong-Soo, JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, v.26, no.1-3, pp.981 - 984, 2003-01 |
| Mechanical alloying process of 93W-5.6Ni-1.4Fe tungsten heavy alloy 류호진; Hong, Soon-Hyung; Baek, WH, JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, v.63, no.1-3, pp.292 - 297, 1997-01 |
| Mechanical and Electrical Properties of Carbon Nanotube/Cu Nanocomposites by Molecular-Level Mixing and Controlled Oxidation Process Lim, Byung K.; Mo, Chan B.; Nam, Dong H.; Hong, Soon-Hyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.10, no.1, pp.78 - 84, 2010-01 |
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