Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Title 

Showing results 12501 to 12520 of 19291

12501
Residual Porosities in Liquid Phase Sintered W-Ni-Fe

Kang, Suk-Joong L, Pleum, pp.173 - 178, 1985-12-01

12502
Residual stress analysis of Pt bottom electrodes on ZrO2/SiO2/Si and SiO2/Si substrates for Pb(ZrTi)O-3 thick films

Jeon, Y; Kim, DG; No, Kwangsoo; Kim, SJ; Chung, J, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.5A, pp.2705 - 2709, 2000-05

12503
Residual Stress and Crystal Growth of Y2O3 thermal barrier coating

최시경; Choi, HM, 한국요업학회, pp.43 -, 1994

12504
Residual Stress and Electrical Property with Deposition Parameter of Low Dielectric SiOF Thin Films Deposited by ECRCVD

최시경; 김석필, 추계 한국요업학회, pp.166 -, 1997

12505
Residual stress and interfacial reaction of the electroplated Ni-Cu alloy under bump metallurgy in the flip-chip solder joint

Kim, SH; Kim, JY; Yu, Jin; Lee, TY, JOURNAL OF ELECTRONIC MATERIALS, v.33, no.9, pp.948 - 957, 2004-09

12506
Residual stress effect on self-annealing of electroplated copper

Lee, CH; Park, Chong-Ook, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.42, no.7, pp.4484 - 4488, 2003-07

12507
Residual Stress Measurement of SiC tile/Al7075 Hybrid Composites by Neutron Diffraction

Park, Jongbok; Lee, Junho; Lee, Sang Bok; Lee, Sang Kwan; Rifai Muslih, M; Hong, Soon Hyung; Ryu, Ho Jin, 한국원자력학회 2016 춘계학술발표회, 한국원자력학회, 2016-05-12

12508
Residual stress measurements in electroless plated Ni-P films

Song, JY; Yu, Jin, THIN SOLID FILMS, v.415, no.1-2, pp.167 - 172, 2002-08

12509
Residual Stress of Diamond Film deposited by Hot-Filament CVD

최시경; Jung, DY, 한국요업학회, pp.40 -, 1994

12510
Residual stresses in spray-formed A2 tool steel

h.m.hu; e.j.lavernia; z.h.lee; d.r.white, JOURNAL OF MATERIALS RESEARCH, v.14, no.12, pp.4521 - 4530, 1999-12

12511
Resilient High Catalytic Performance of Platinum Nanocatalysts with Porous Graphene Envelope

Kim, Heeyeon; Robertson, Alex W.; Kim, Sang Ouk; Kim, Jong Min; Warner, Jamie H., ACS NANO, v.9, no.6, pp.5947 - 5957, 2015-06

12512
Resistive probe storage: R/W mechanism

No, Kwangsoo; Hong, Seoung Bum; Ko, Hyoung Soo; Min, Dong Ki; Jung, Ju Hwan; Nam, Yun Woo; Park, Hong Sik, 2006 MRS spring meeting, v.0, no.0, pp.0 - 0, MRS, 2006-04-18

12513
Resistive Probe Storage: R/W Mechanism

No, Kwangsoo; Hong, S; Ko, H; Min, DK; Jung, JH; Park, H; Park, C, International Probe Storage Workshop III, v.0, no.0, pp.0 - 0, IBM Zurich Research Laboratory, 2005-03-01

12514
Resistive switching characteristics in asymmetric reduced graphene oxide/graphene oxide bilayers

Kim, Sung Kyu; Lee, Jeong Yong; Jeong, Hu Young, 2015 14th International Union of Materials Research Societies-International Conference on Advanced Materials, IUMRS-ICAM, 2015-10-28

12515
Resistive switching mechanism of $TiO_2$ thin films grown by plasma-enhanced atomic layer deposition = PEALD 방법으로 성장된 $TiO_2$ 박막의 저항변화 메커니즘에 관한 연구link

Jeong, Hu-Young; 정후영; et al, 한국과학기술원, 2010

12516
Resistivity, step coverage and barrier property of TiN/Ti films prepared by electron cyclotron resonance plasma enhanced chemical vapor deposition

Lee, Won-Jong, Proceedings of ULSI XII : 1996 Advanced Metallization and Interconnect Systems for ULSI Applications, pp.297 - 303, 1997-01-01

12517
Resonant photoemission spectroscopy and theoretical calculation of the valence band structure in chromium aluminum oxynitride

Choi, Young Min; Chang, Hyun Ju; Ryu, Beyong Hwan; Kong, Ki Jeong; Lee, Jae Do; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.42, pp.7570 - 7573, 2003-12

12518
Response to "Comment on Effect of growth interruptions on the light emission and indium clustering of InGaN/GaN multiple quantum wells " [Appl. Phys. Lett. 81, 3100 (2002)]

Cho, HK; Lee, JeongYong; Sharma, N; Humphreys, CJ; Yang, GM; Kim, CS; Song, JH; et al, APPLIED PHYSICS LETTERS, v.81, no.16, pp.3102 - 3103, 2002-10

12519
Response to microwave irradiation of $YBa_2Cu_3O_x$ thin film microbridges with different film morphologies = $YBa_2Cu_3O_x$ 박막을 이용한 마이크로파 검지소자의 박막형상 변화에 따른 검지특성 변화에 관한 연구link

Shin, Woo-Suck; 신우식; et al, 한국과학기술원, 1994

12520
Response to the comment on the article "New solid-state electrochemical method of measuring dissolved hydrogen in Al melt" by SG Kim, BH Jung, CO Park, RA Rapp

Park, Chong-Ook, SENSORS AND ACTUATORS B-CHEMICAL, v.261, pp.598 - 601, 2018-05

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