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Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric film Choi, Chul-Min; Oh, Young-Taek; Kim, Kyung-Jun; Park, Jin-Suk; Sukegawa, Hiroaki; Mitani, Seiji; Kim, Sung Kyu; et al, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.31, no.7, 2016-07 |
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