Showing results 1 to 7 of 7
Comparative studies on electrical bias temperature instabilities of In-Ga-Zn-O thin film transistors with different device configurations Ryu, Min-Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; Yoon, Sung-Min, SOLID-STATE ELECTRONICS, v.89, pp.171 - 176, 2013-11 |
Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs) Kim, Choong-Ki; Kim, Eungtaek; Lee, Myung Keun; Park, Jun-Young; Seol, Myeong-Lok; Bae, Hagyoul; Bang, Tewook; et al, ACS APPLIED MATERIALS & INTERFACES, v.8, no.36, pp.23820 - 23826, 2016-09 |
Nonvolatile Charge-Trap Memory Transistors With Top-Gate Structure Using In-Ga-Zn-O Active Channel and ZnO Charge-Trap Layer Bak, Jun Yong; Ryu, Min-Ki; Park, Sang Hee Ko; Hwang, Chi Sun; Yoon, Sung Min, IEEE ELECTRON DEVICE LETTERS, v.35, no.3, pp.357 - 359, 2014-03 |
Oxide Semiconductor-Based Organic/Inorganic Hybrid Dual-Gate Nonvolatile Memory Thin-Film Transistor Yoon, Sung-Min; Yang, Shinhyuk; Ryu, Min-Ki; Byun, Chun-Won; Jung, Soon-Won; Park, Sang-Hee Ko; Hwang, Chi-Sun; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.7, pp.2135 - 2142, 2011-07 |
Oxide-Thin-Film-Transistor-Based Ferroelectric Memory Array Kim, Byeong Hoon; Byun, Chun Won; Yoon, Sung-Min; Yang, Shin Hyuk; Jung, Soon-Won; Ryu, Min Ki; Park, Sang-Hee Ko; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.3, pp.324 - 326, 2011-03 |
The effect of ITO and Mo electrodes on the properties and stability of In-Ga-Zn-O thin film transistors Park, Jozeph; Kim, Chang Sun; Kim, Yang Soo; Park, Yun Chang; Park, Hyung Jin; Bae, Byeong-Soo; Park, Jin-Seong; et al, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.129 - 134, 2016-06 |
Vertical Channel ZnO Thin-Film Transistors Using an Atomic Layer Deposition Method Hwang, Chi-Sun; Park, Sang-Hee Ko; Oh, Himchan; Ryu, Min-Ki; Cho, Kyoung-Ik; Yoon, Sung-Min, IEEE ELECTRON DEVICE LETTERS, v.35, no.3, pp.360 - 362, 2014-03 |
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