DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shim J.H. | ko |
dc.contributor.author | Cho, Hyungsuck | ko |
dc.contributor.author | Kim S. | ko |
dc.date.accessioned | 2007-10-23T05:51:11Z | - |
dc.date.available | 2007-10-23T05:51:11Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997-10-14 | - |
dc.identifier.citation | Sensors and Controls for Advanced Manufacturing, pp.50 - 58 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.uri | http://hdl.handle.net/10203/1756 | - |
dc.description | Copyright 1998 Society of Photo-Optical Instrumentation Engineers. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | International Society for Optical Engineering (SPIE) | - |
dc.title | An optical sensor of a probing system for inspection of PCBs | - |
dc.type | Conference | - |
dc.identifier.wosid | 000071860200006 | - |
dc.identifier.scopusid | 2-s2.0-58849108954 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 50 | - |
dc.citation.endingpage | 58 | - |
dc.citation.publicationname | Sensors and Controls for Advanced Manufacturing | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Pittsburgh, PA | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Cho, Hyungsuck | - |
dc.contributor.nonIdAuthor | Shim J.H. | - |
dc.contributor.nonIdAuthor | Kim S. | - |
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