Statistical properties of the electrically induced contact resistance between two stainless steel balls

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The electrical contact resistance between two stainless steel balls was measured to study the electrical conduction of a metallic contact separated by a thin oxide layer. Through a statistical approach, the contact resistance was found to have a bimodal log-normal distribution. This result reflects conduction by tunneling and electrically induced metal bridge, which was explained by the simulation of a random circuit breaker model, inside the insulating layer. Based on the results of this study, we suggest an effective conduction model to explain macroscopic electrical contact systems with a nano-or microscopic filamentary conduction mechanism. (C) 2013 AIP Publishing LLC.
Publisher
AMER INST PHYSICS
Issue Date
2013-06
Language
English
Article Type
Article
Citation

APPLIED PHYSICS LETTERS, v.102, no.24

ISSN
0003-6951
DOI
10.1063/1.4811354
URI
http://hdl.handle.net/10203/175588
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