Statistical properties of the electrically induced contact resistance between two stainless steel balls

Abstract

The electrical contact resistance between two stainless steel balls was measured to study the electrical conduction of a metallic contact separated by a thin oxide layer. Through a statistical approach, the contact resistance was found to have a bimodal log-normal distribution. This result reflects conduction by tunneling and electrically induced metal bridge, which was explained by the simulation of a random circuit breaker model, inside the insulating layer. Based on the results of this study, we suggest an effective conduction model to explain macroscopic electrical contact systems with a nano-or microscopic filamentary conduction mechanism. (C) 2013 AIP Publishing LLC.