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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

A new type of spectral FLIM : Improving accuracy of lifetime measurement

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dc.contributor.authorJeong, Hyeong-Jun-
dc.contributor.authorAhn, Jin-Woo-
dc.contributor.authorLee, Dong-Ryoung-
dc.contributor.authorGweon, Dae-Gab-
dc.date.accessioned2013-03-29T15:59:48Z-
dc.date.available2013-03-29T15:59:48Z-
dc.date.created2012-08-13-
dc.date.issued2012-04-03-
dc.identifier.citationFocus on Microscopy 2012, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/171946-
dc.languageENG-
dc.titleA new type of spectral FLIM : Improving accuracy of lifetime measurement-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameFocus on Microscopy 2012-
dc.identifier.conferencecountrySingapore-
dc.identifier.conferencecountrySingapore-
dc.contributor.localauthorGweon, Dae-Gab-
dc.contributor.nonIdAuthorJeong, Hyeong-Jun-
dc.contributor.nonIdAuthorAhn, Jin-Woo-
dc.contributor.nonIdAuthorLee, Dong-Ryoung-
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ME-Conference Papers(학술회의논문)
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