DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahn M. | - |
dc.contributor.author | Kim T. | - |
dc.contributor.author | Kim Y. | - |
dc.contributor.author | Gweon, Dae-Gab | - |
dc.date.accessioned | 2013-03-28T09:06:05Z | - |
dc.date.available | 2013-03-28T09:06:05Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2010-10-25 | - |
dc.identifier.citation | 2010 International Symposium on Optomechatronic Technologies, ISOT 2010, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/164366 | - |
dc.language | ENG | - |
dc.title | Line scanning confocal microscopy with the use of cross structured illumination | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-79951493064 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2010 International Symposium on Optomechatronic Technologies, ISOT 2010 | - |
dc.identifier.conferencecountry | Canada | - |
dc.identifier.conferencecountry | Canada | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Ahn M. | - |
dc.contributor.nonIdAuthor | Kim T. | - |
dc.contributor.nonIdAuthor | Kim Y. | - |
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