DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chun, BS | - |
dc.contributor.author | Kim,T J | - |
dc.contributor.author | Yoo, HK | - |
dc.contributor.author | Lee, SW | - |
dc.contributor.author | Gweon, Dae-Gab | - |
dc.date.accessioned | 2013-03-28T02:52:14Z | - |
dc.date.available | 2013-03-28T02:52:14Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-04-13 | - |
dc.identifier.citation | Focus on Microscopy 2008, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/162394 | - |
dc.language | ENG | - |
dc.title | EFFECT OF SCATTERING COEFFICIENT ON THE AXIAL RESOLUTION OF REFLECTANCE CONFOCAL MICROSCOPY IN TURBID MEDIA | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Focus on Microscopy 2008 | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Chun, BS | - |
dc.contributor.nonIdAuthor | Kim,T J | - |
dc.contributor.nonIdAuthor | Yoo, HK | - |
dc.contributor.nonIdAuthor | Lee, SW | - |
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